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  ? 2010 fairchild semiconductor corporation nds9948 rev b1 (w) nds9948 dual 60v p-channel powertrench ? ?? ? mosfet general description this p-channel mosfet is a rugged gate version of fairchild semiconductor?s advanced powertrench process. it has been optimized for power management applications requiring a wide range of gate drive voltage ratings (4.5v ? 20v). applications ? power management ? load switch ? battery protection features ? ?2.3 a, ?60 v r ds(on) = 250 m ? @ v gs = ?10 v r ds(on) = 500 m ? @ v gs = ?4.5 v ? low gate charge (9nc typical) ? fast switching speed ? high performance trench technology for extremely low r ds(on) ? high power and current handling capability s d s s so-8 d d d g d2 d2 d1 d1 s2 g2 s1 g1 pin 1 so-8 4 3 2 1 5 6 7 8 q1 q2 absolute maximum ratings t a =25 o c unless otherwise noted symbol parameter ratings units v dss drain-source voltage ?60 v v gss gate-source voltage 20 v i d drain current ? continuous (note 1a) ?2.3 a ? pulsed ?10 power dissipation for dual operation 2 power dissipation for single operation (note 1a) 1.6 (note 1b) 1.0 p d (note 1c) 0.9 w t j , t stg operating and storage junction temperature range ?55 to +175 c thermal characteristics r ja thermal resistance, junction-to-ambient (note 1a) 78 c/w (note 1c) 135 c/w r jc thermal resistance, junction-to-case (note 1) 40 c/w package marking and ordering information device marking device reel size tape width quantity nds9948 nds9948 13?? 12mm 2500 units nds9948 january 2 010
nds9948 rev b 1 (w) electrical characteristics t a = 25c unless otherwise noted symbol parameter test conditions min typ max units drain-source avalanche ratings (note 2) w dss drain-source avalanche energy single pulse, v dd =?54 v 1 5 mj i ar drain-source avalanche current off characteristics bv dss drain?source breakdown voltage v gs = 0 v, i d = ?250 a ?60 v ?bv dss ? t j breakdown voltage temperature coefficient i d = ?250 a, referenced to25 c ?52 mv/ c i dss zero gate voltage drain current v ds = ?40 v, v gs = 0 v v ds = ?40 v,v gs = 0 v t j =?55 c ?2 ?25 a i gssf gate?body leakage, forward v gs = 20 v, v ds = 0 v 100 na i gssr gate?body leakage, reverse v gs = ?20 v v ds = 0 v ?100 na on characteristics (note 2) v gs(th) gate threshold voltage v ds = v gs , i d = ?250 a ?1 ?1.5 ?3 v ?v gs(th) ? t j gate threshold voltage temperature coefficient i d = ?250 a, referenced to25 c 4 mv/ c r ds(on) static drain?source on?resistance v gs = ?10 v, i d = ?2.3 a v gs = ?4.5 v, i d = ?1.6 a v gs = ?10 v,i d = ?2.3a, t j =125 c 138 175 225 250 500 433 m ? i d(on) on?state drain current v gs = ?10 v, v ds = ?5 v ?10 a g fs forward transconductance v ds = ?10 v, i d = ?2.3 a 5 s dynamic characteristics c iss input capacitance 394 pf c oss output capacitance 53 pf c rss reverse transfer capacitance v ds = ?30 v, v gs = 0 v, f = 1.0 mhz 23 pf switching characteristics (note 2) t d(on) turn?on delay time 6 12 ns t r turn?on rise time 9 18 ns t d(off) turn?off delay time 16 29 ns t f turn?off fall time v dd = ?30 v, i d = ?1 a, v gs = ?10 v, r gen = 6 ? 3 6 ns q g total gate charge 9 13 nc q gs gate?source charge 1.4 nc q gd gate?drain charge v ds = ?30 v, i d = ?2.3 a, v gs = ?10 v 1.7 nc nds9948 ?10 a
nds9948 rev b 1 (w) electrical characteristics (cont.) t a = 25c unless otherwise noted symbol parameter test conditions min typ max units drain?source diode characteristics and maximum ratings i s maximum continuous drain?source diode forward current ?1.7 a v sd drain?source diode forward voltage v gs = 0 v, i s = ?1.7 a (note 2) ?0.8 ?1.2 v t rr reverse recovery time v gs = 0 v, i f = ?2.3a, di f /dt = 100a/ s 25 ns notes: 1. r ja is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the so lder mounting surface of the drain pins. r jc is guaranteed by design while r ca is determined by the user's board design. ` a) 78c/w when mounted on a 0.5in 2 pad of 2 oz copper b) 125c/w when mounted on a 0.02 in 2 pad of 2 oz copper c) 135c/w when mounted on a minimum pad. scale 1 : 1 on letter size paper 2. pulse test: pulse width < 300 s, duty cycle < 2.0% nds9948
nds9948 rev b 1 (w) typical characteristics 0 2 4 6 8 10 0123456 -v ds , drain to source voltage (v) -i d , drain current (a) v gs = -10v -3.0v -3.5v -4.0v -4.5v -6.0v 0.8 1 1.2 1.4 1.6 1.8 0246810 -i d , drain current (a) r ds(on) , normalized drain-source on-resistance v gs =-3.5v -4.0v -6.0v -10v -4.5v figure 1. on-region characteristics. figure 2. on-resistance variation with drain current and gate voltage. 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 -50 -25 0 25 50 75 100 125 150 175 t j , junction temperature ( o c) r ds(on) , normalized drain-source on-resistanc e i d = -2.3a v gs = -10v 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.5 24681 0 -v gs , gate to source voltage (v) r ds(on) , on-resistance (ohm) i d = -1a t a = 125 o c t a = 25 o c figure 3. on-resistance variation withtemperature. figure 4. on-resistance variation with gate-to-source voltage. 0 1 2 3 4 5 6 11.522.533.54 -v gs , gate to source voltage (v) -i d , drain current (a) t a = -55 o c 25 o c 125 o c v ds = -5v 0.0001 0.001 0.01 0.1 1 10 100 0 0.2 0.4 0.6 0.8 1 1.2 -v sd , body diode forward voltage (v) -i s , reverse drain current (a) v gs =0v t a = 125 o c 25 o c -55 o c figure 5. transfer characteristics. figure 6. body diode forward voltage variation with source current and temperature. nds9948
nds9948 rev b 1 (w) typical characteristics 0 2 4 6 8 10 0246810 q g , gate charge (nc) -v gs , gate-source voltage (v) i d = -2.3 a v ds = -20v -30v -40v 0 100 200 300 400 500 600 0 102030405060 -v ds , drain to source voltage (v) capacitance (pf) c iss c oss c rss f = 1 mhz v gs = 0 v figure 7. gate charge characteristics. figure 8. capacitance characteristics. 0.01 0.1 1 10 100 0.1 1 10 100 -v ds , drain-source voltage (v) -i d , drain current (a ) dc 1s 100ms 100 r ds(on) limit v gs = -10v single pulse r ja = 135 o c/w t a = 25 o c 10ms 1ms 10s 0 10 20 30 40 50 0.001 0.01 0.1 1 10 100 1000 t 1 , time (sec) p(pk), peak transient power (w) single pulse r ja = 135c/w t a = 25c figure 9. maximum safe operating area. figure 10. single pulse maximum power dissipation. 0.001 0.01 0.1 1 0.0001 0.001 0.01 0.1 1 10 100 1000 t 1 , time (sec) r(t), normalized effective transien t thermal resistance r ja (t) = r(t) * r ja r ja = 135 o c/w t j - t a = p * r ja (t) duty cycle, d = t 1 / t 2 p (p k ) t 1 t 2 single pulse 0.01 0.02 0.05 0.1 0.2 d = 0.5 figure 11. transient thermal response curve. thermal characterization performed using the conditions described in note 1c. transient thermal response will change depending on the circuit board design. nds9948
trademarks the following includes registered and unregistered trademarks and service marks, owned by fairchild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. *trademarks of system general corporation, us ed under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes with out further notice to any products herein to improve reliability, function, or design. fairchild does not assume an y liability arising out of the application or use of any product or circuit described herein; neither does it convey an y license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild?s worldwide terms and conditions, specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized for use as critical co mponents in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used herein: 1. life support devices or systems ar e devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a signi ficant injury of the user. 2. a critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life sup port device or system, or to affect its safety or effectiveness. product status definitions definition of terms accupower? auto-spm? build it now? coreplus? corepower? crossvolt ? ctl? current transfer logic? deuxpeed ? dual cool? ecospark ? efficentmax? ezswitch?* ?* fairchild ? fairchild semiconductor ? fact quiet series? fact ? fast ? fastvcore? fetbench? flashwriter ? * fps? f-pfs? frfet ? global power resource sm green fps? green fps? e-series? g max ? gto? intellimax? isoplanar? megabuck? microcoupler? microfet? micropak? micropak2? millerdrive? motionmax? motion-spm? optihit? optologic ? optoplanar ? ? pdp spm? power-spm? powertrench ? powerxs? programmable active droop? qfet ? qs? quiet series? rapidconfigure? saving our world, 1mw/w/kw at a time? signalwise? smartmax? smart start? spm ? stealth? superfet? supersot?-3 supersot?-6 supersot?-8 supremos? syncfet? sync-lock? ?* the power franchise ? ? tinyboost? tinybuck? tinycalc? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? trifault detect? truecurrent?* serdes? uhc ? ultra frfet? unifet? vcx? visualmax? xs? tm ? tm tm datasheet identification product status definition advance information formative / in design datasheet contains the design specifications for product development. specifications may change in any manner without notice. preliminary first production datasheet contains preliminary data; supp lementary data will be published at a later date. fairchild semiconductor reserves the ri ght to make changes at any time without notice to improve design. no identification needed full production datasheet contains final specifications. fair child semiconductor reserves the right to make changes at any time without notice to improve the design. obsolete not in production datasheet contains specifications on a product t hat is discontinued by fairchild semiconductor. the datasheet is for reference information only. anti-counterfeiting policy fairchild semiconductor corporation?s anti-counterfeiting policy. fairchild?s anti-counterfeiting policy is also stated on our external website, www.fairchildsemi.com, under sales support . counterfeiting of semiconductor parts is a growing problem in the industry. all manufactures of semiconductor products are expe riencing counterfeiting of their parts. customers who inadvertently purchase counterfeit parts experi ence many problems such as loss of brand reputation, substa ndard performance, failed application, and increased cost of production and manufacturing del ays. fairchild is taking strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. fairchild strongly encourage s customers to purchase fairchild parts either directly from fa irchild or from authorized fairchild distributors who are listed by country on our web page cited above. products customers buy either from fairchild directly or fr om authorized fairchild distributors are genuine parts, have full traceability, meet fairchild?s quality standards for handing and storage and provide access to fairchild?s full range of up-to-date technical and product information. fairchild and our authorized distributors will stand behind all warranties and wi ll appropriately address and warranty issues that may arise. fairchild will not provide any wa rranty coverage or other assistance for parts bought from unau thorized sources. fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors. rev. i46 ?


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